OHLABS Corp.’s SAM systems enable precise inspection of a wide range of materials and components, including semiconductor wafers, power semiconductors, electrical and electronic components, automotive secondary batteries, composite materials, Glass PCBs, and ceramics.
By non-destructively detecting microscopic internal defects, the system allows early identification of potential issues
and effectively reduces cost losses caused by quality failures.

With these strengths, OHLABS SAM systems deliver significant value across industries that demand high quality and reliability, including semiconductor manufacturing, electronic component reliability evaluation, the energy sector, as well as the automotive and aerospace industries.