Dual FSAM
Top, Bottom, and Through-Transmission Data Captured Simultaneously
Ultrasonic NDT System for Simultaneous Dual-Side Inspection of Thick Samples
DUAL FSAM is an industry-first ultrasonic inspection system developed by OHLABS, featuring a proprietary high-speed scanning module that enables simultaneous inspection of both sides of a sample.
Simultaneous Dual-Side Scanning
Top and bottom surfaces are scanned at the same time for complete analysis in a single pass
Triple Data
Acquisition
Collects top-surface, bottom-surface, and through-transmission data simultaneously
Optimized for Thick Samples
Delivers high-resolution imaging for power semiconductors, ceramics, and composite materials
Dramatically Reduced Inspection Time
Significantly shortens inspection cycles to maximize productivity
A New Standard in Speed, Penetration, and Precision
Next-generation ultrasonic solution combining efficiency with high-resolution performance
Video
Application Samples & Scanning Images
Technical
Specifications
| Technical Specifications | |
|---|---|
| Model | Dual FSAM |
| Scanning range | 76 (X) x 70 (Y) mm |
| Scanning velocity | 20fps |
| Step size | 10 ~ 200 µm |
| Frequency range | 5 ~ 200 MHz |
| Number of channels | 8 |
| Digitizer | PCle 16bits 1GSPS |
| Size | 840 (W) x 740 (D) x 300 (H) mm |
| Weight | 100 kg |
※ All specifications are fully customizable to meet customer requirements.