팝업레이어 알림

팝업레이어 알림이 없습니다.

Beyond Inspection

Towards Innovation

A world invisible to light, revealed by ultrasound

Precision defines trust in industry

Semiconductor Wafer
Semiconductor Wafer
Power Semiconductor
Power Semiconductor
Electrical & Electronic Components
Electrical & Electronic Components
Secondary Battery
Secondary Battery
Composite Material
Composite Material
Semiconductor Wafer
Semiconductor Wafer
Power Semiconductor
Power Semiconductor
Electrical & Electronic Components
Electrical & Electronic Components
Secondary Battery
Secondary Battery
Composite Material
Composite Material

Where trust continues, technology responds

  • Technology

    Technology

    A Scanning Acoustic Microscope (SAM) is a high-resolution inspection system that uses ultrasound to visualize the internal structure of materials without damage.

  • Directions

    오시는 길

    Room 1225, Ungbi Building, Daeyeon Campus, Pukyong National University, Yongso-ro, Nam-gu, Busan, 48513, Republic of Korea

  • Customer Support

    Customer Support

    OHLABS Co., Ltd. provides precise technical support and a structured maintenance system to support your research and production. Please feel free to contact us at any time.