A New Standard in Non-Destructive Testing Enabled by Ultrasound

Scanning Acoustic Microscopy (SAM) is an advanced ultrasonic non-destructive inspection system that enables high-resolution imaging of internal structures using ultrasound.

Based on OHLABS Corp.’s proprietary technologies, SAM provides micrometer-level (µm) resolution analysis of internal defects and structural features across a wide range of industries, including semiconductors, electronic packaging, and advanced materials.

Furthermore, SAM delivers clear and reliable inspection results in areas where optical inspection or X-ray techniques face inherent limitations, making it a powerful tool for applications ranging from research and development to in-line production quality control.